SEMETROL - Semiconductor Metrology Solutions

New standards in resolution and sensitivity for characterization.

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SEMETROL was founded in 2005 to develop and market advanced semiconductor characterization and analysis systems. The characterization methods include deep level transient spectroscopy (DLTS), current-voltage-temperature (IVT), capacitance-voltage (CV), photocapacitance (PC), temperature dependent Hall effect (TDH), thermal admittance spectroscopy (TAS), and others.

Advanced data collection analysis methods have been implemented in the products to accelerate the thorough characterization of semiconductor materials, and assist in improving material and device quality. Each system has been carefully designed to produce sensible results.

Based on the founder's experience in military and university laboratory facilites, new users of sophisticated characterization equipment face a daunting challenge to understand not only the physics behind the measurements, but also the operational challenges of obtaining valid data, and even more so, of obtaining valid analysis. SEMETROL's goal is to build characterization equipment where the user can quickly change experimental conditions and see the results graphically while setting up experiments, quickly collect low-noise data, and provide a robust analysis environment, resulting in high confidence in the methods.