SEMETROL was started in 2005 to develop and market advanced semiconductor characterization and analysis systems. The characterization methods include deep level transient spectroscopy (DLTS), current-voltage-temperature (IVT), capacitance-voltage profiling (CV), photoadmittance spectroscopy (PAS), thermal admittance spectroscopy (TAS), and other related methods.
Advanced data collection and analysis methods have been implemented in the products to accelerate thorough characterization of semiconductor materials, and assist in improving material and device quality.
Each system has been carefully designed to produce accurate results very efficiently. New users of sophisticated characterization equipment face a daunting challenge to understand not only the physics behind the measurements, but also the operational challenges of obtaining valid data, and even more so, of obtaining valid analysis.