Semetrol, LLC provides characterization and analysis services. Call to discuss the goals of your sample characterization needs.
Characterization services have been provided to several companies and universities, including Alta Devices, Amethyst, Coherent, CSUN, CyOptics, Fairchild, Finisar, First Solar, GeneSiC, Infinera, Izar Solar, JPL, LLNL, LMMS, Macom, Microsemi, MIT, Novati, NTT, Polar Semiconducor, Princeton Lightwave, Redlen, SatCon, Sionyx, Solexel, TI, TriQuint, UDC, U Illinois, UM-KC, U Virginia, RMD.
Providing characterization services also has the benefit of stimulating ideas for improvements in the hardware and software for the characterization and analysis systems.
IV - Room temperature measurement of the series resistance, shunt resistance, ideality, and Vbi.
CV - Room temperature measurment of the ns(x) and Vbi.
IVT - Measurements of the conduction mechanisms (forward and reverse), dominant generation and recombination center energies, Rs(T), Rsh(T), over a 20 - 700K temperature range.
DLTS - Measurements of the trap spectrum, energies, capture cross sections, concentrations over a 20 - 700K temperature range. This is also capable of measuring optical DLTS. It includes room temperature IV and CV, whihc is used for DLTS setup.
TAS - Measuremetns of the conductance and capacitance modes, defect spectrum, energies, capture cross section, and concentration over a 20 - 700K temperature range. Usful for high resistivity samples.
DLTS Capture - Capture kinetics: lattice relaxation, capture barrier, and dislocations.
DDLTS Profile or Field - Measures deep level profile or field depedence.
CTS - Measures trap spectrum, energies, capture cross section, and conccentration. variations include photoinduced CTS (PICTS). Usful for high resistivity samples.