The figures, from left to right, describe the steady state conditions, the trap filling conditions, and the measurement conditions, respectively. In this case, the device is an n-type Schottky diode.  Under steady state conditions, the traps at ET have all been emptied of charges. The dashed horizontal line is the Fermi level position. An energy level at the Fermi position has a 50% chance of being occupied. Below the Fermi level, the traps are mostly occupied. Above the Fermi level, the traps are mostly empty. A voltage is applied to move the Fermi level towards the conduction band, bringing the Fermi level above the energy of the traps in the region that was depleted of charges. A voltage is then applied that widens the depletion region. The trapped charges are emitted when avoltage is applied that brings the Fermi level below the energy of the traps in the depletion region. The emission is measured as a change in capacitance.
A peak is generated from the transients as described in the graph. The difference in capacitance at the sampling points is small at low temperatures (bottom), increases at intermediate temperatures, and decreases again at high temperatures (top), resulting in the formation of a peak in a plot of the spectrum of traps, known as the ratewindow plot.
	You can quickly see the effect of changes in measurement conditions during setup. Once the conditions are acceptable, the temperature range, step size, file name and other information is entered, and the measurements are automated once the user presses 'Start'. The number of transients averaged together can also be set by the user to obtain either a quick scan or a very sensitive data collection. The user also has control over the temperature stabilization, setting a small stabilization count for a quick scan, or longer for more accurate results. The manual explains how to optimize the measurement conditions, including the temperature stabilization, for accuracy and precision. The measurements are extremely sensitive. Transients with amplitude less than 0.5 fF can be measured routinely.
Ratewindow analysis is done either automatically, or semi-automatically. The analysis program plots the ratewindow, and the user selects a range of temperatures for peaks of interest. The program finds the peak positions automatically, and generates the Arrhenius plot for energy and capture cross section calculations. Several ratewindows are generated automatically. The user then uses a cursor to select points to include in the Arrhenius analysis. The process takes only a few minutes.
	An alternative method of analysis fits each transient for exponential components. This method is very useful when there are trap signals overlapping in the same temperature range. However, it requires a relatively strong signal. Ratewindow analysis is more sensitive for low level signals. Both are provided. The analysis program includes several windows: 3D plot of all data, ratewindow plot for saving, ratewindow analysis, comparison of simulation to ratewindow data, fit individual transients, fit all transients and save fit values.