Advanced data collection and analysis methods have been implemented in the products to accelerate thorough characterization of semiconductor materials, and assist in improving material and device quality.
Each system has been carefully designed to produce accurate results very efficiently. New users of sophisticated characterization equipment face a daunting challenge to understand not only the physics behind the measurements, but also the operational challenges of obtaining valid data, and even more so, of obtaining valid analysis.
- Accelerate semiconductor material development.
- Advance knowledge and understanding of semiconductor materials.
- Continue advancing the capabilities of semiconductor characterization systems.
- Easy to use.
- Programmed to quickly collect low-noise data
- Provide a robust analysis environment.
- Furnish simulation utilities to validate results, establishing high confidence in the methods and results.
His interest and experience in semiconductor properties were stimulated and formed while working in two of the Air Force research laboratories, and as a program manager for basic research in optoelectronic materials at the Air Force Office of Scientific Research. At AFOSR he started several multi-million dollar research programs, starting new basic research initiatives in chalcopyrite non-linear optical materials, phonons in device structures, and next-generation epitaxial crystal growth. Working at Virginia Commonwealth University as an Associate Professor provided day-to-day interface with graduate studends and post-docs, maintaining focus on grants and contracts progress.
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