Semetrol Provides:


  • Advanced semiconductor spectroscopy systems.
    • Deep Level Transient Spectroscopy and related methods.
    • Thermal Admittance Spectroscopy
    • Current-Voltage-Temperature Characterization
    • Photocapacitance
  • Cryocoolers: Low vibration, wide temperature range.
  • Consulting services.

Benefits:


  • Develop and optimize semiconductor materials
  • Refine synthesis conditions
  • Provide critical feedback on electrical crystal defects.
    • Point defects
    • Extended defects - dislocations, clusters
    • Genertion/recombination centers
  • Identify where deep level defects are limiting device efficiency. Improve device efficiency.
  • Generate information essential for progress reports, technical jounal articles, proposals.


3D DLTS Spectrum

Deep Level Transient Spectroscopy

DLTS measurements provide information on point defect and extended defect characteristics through time resolved capacitance transient spectroscopy: trap energy, capture cross section, and concentration.

SEMETROL's DLTS system is designed for ease-of-use by new users, and in-depth investigations by experienced users.

The DLTS system consists of all spectrometer software and spectroscopy equipment required to perform DLTS measurements and analysis.

More about DLTS

Current - Voltage - Temperature

IVT provides information on the current paths that include generation in the depletion region of a reverse biased diode, or recombination under forward bias conditions.

Measurement of current-voltage curves over temperature provides a link between the spectrum of defects obtained in DLTS or TAS and the device operation.

More about IVT

3D IVT plot

Thermal Admittance Spectroscopy

TAS measurements provide information on point defect characteristics: trap energy, capture cross section, concentration. The samples include low-doped diodes where DLTS is not applicable. Admittance spectroscopy is therefore complementary to the DLTS method.

The TAS system consists of all software and hardware required to perform thermal admittance spectroscopy measurements and analysis. The frequencies span several orders of magnitude, resulting in very accurate energy measurements over several orders of magnitude.

More about TAS

3D TAS spectrum plot

Photoadmittance Spectroscopy

Photoadmittance spectroscopy system provides information on the optical ionization energy of point defects in semiconductor materials. The illumination is scanned from low to high energy while measuring the capacitance and conductance. When the threshold energy is reached to release the trapped charge from the point defect, a step appears in the capacitance measurement, or peak in the conductance.

More about PAS

Photocapacitance spectra