Deep Level Transient Spectroscopy
DLTS measurements provide information on point defect and extended defect characteristics through time resolved capacitance transient spectroscopy: trap energy, capture cross section, and concentration.
SEMETROL's DLTS system is designed for ease-of-use by new users, and in-depth investigations by experienced users.
The DLTS system consists of all spectrometer software and spectroscopy equipment required to perform DLTS measurements and analysis.
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Current - Voltage - Temperature
IVT provides information on the current paths that include generation in the depletion region of a reverse biased diode, or recombination under forward bias conditions.
Measurement of current-voltage curves over temperature provides a link between the spectrum of defects obtained in DLTS or TAS and the device operation.
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Thermal Admittance Spectroscopy
TAS measurements provide information on point defect characteristics: trap energy, capture cross section, concentration. The samples include low-doped diodes where DLTS is not applicable. Admittance spectroscopy is therefore complementary to the DLTS method.
The TAS system consists of all software and hardware required to perform thermal admittance spectroscopy measurements and analysis. The frequencies span several orders of magnitude, resulting in very accurate energy measurements over several orders of magnitude.
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